http://www.eecg.utoronto.ca/~veneris/10aspdac.pdf Debugging is still the most time consuming part of IC design. Typical debug includes: (a) find out the checkers that indicate errors, (b) investigate waveforms of observation points (typically primary outputs) which may propagate errors to the checkers, (c) trace drivers of those observation points, (d) indicate error sources, (e) fix them, and finally (f) [...]
John Zuk![]() |
![]() |
![]() |
While many of us are just getting used to writing “2010” on our documents and personal checks, it’s clear that the economic impact of 2009 will not be forgotten any time soon. The consensus across diverse constituencies – ranging from world leaders to industry heads and many leading economists – is clear. We are not [...]
Read More
Is there a disconnect in your die, package and board design methodology? As technologies evolve to meet demands of higher performance, smaller size and lower cost, there are several challenges in the design of chips, packages and boards which must be addressed with an integrated analysis and verification methodology.
For example, maintaining power integrity means ensuring [...]
Read More
3D die stacking using through silicon vias (TSVs) is an emerging technology with considerable promise in reducing the area, performance and power limitations of transmitting signals between multiple dies. It provides the flexibility of connecting chips performing different functions (memory, processor, power management) and fabricated using different processes inside the same package in a [...]
Read More
Fernando Martinez Vallina
Twitter FeedsPosting tweet...